Reltech 8014

מאת רחלי אפלויג שלישי, 15 מאי 2012 12:39
גרסת הדפסה

Reltech 8014-

 

High Power HTOL System

Today’s low geometry semiconductor devices require a different approach to performing High Temperature Operating Life (HTOL) and “Burn-In”. Core Leakage currents vary greatly between device die, even when from the same wafer, and are significantly higher than those of larger geometry devices. These leakage currents result in self-heating within the device and increased junction temperatures (Tj).

 

 

In order to control the junction temperature to within acceptable limits and to increase product yield, it is necessary to control the temperature of each device

independently. This is not possible in conventional chamber based HTOL systems.

Reltech Limited is pleased to announce the latest addition to its portfolio of semiconductor qualification test systems. The Reltech 8000 series HTOL system incorporating iSocket™ technology is designed for use by Independent Test Houses and semiconductor IDM companies operating their own Quality and Reliability Laboratories and provides the highest level of thermal control possible for High Temperature Operating Life Testing and Burn-In of the very latest low geometry, high power semiconductor devices.

-Reltech 8014 HTOL System Features

iSocket™ Technology

Open Rack – Room Temperature (RTBI) non chamber design

Easy to load trays on telescopic slides

Individual DUT Temperature Measurement & Control

DUT Monitoring with Auto shut down

Multi DUT type HTOL Testing

Remote System & HTOL monitoring- Customer access via VPN


-HTOL System Configuration

Capacity: 14 HTOL Tray Slots

DUT Capacity: Typical 14 x 12 = 168 DUT’s

DUT Power : up to 65W per DUT

I/O: 192 ( 2 x 96 way IDC)

Signal Zones: 14 - 1 per Driver Card Slot

Power Zones: 14 - 1 per HTOL Tray

DUT Power Supplies per HTOL Tray

PSU Qty Volts Current

V1 4 0.6v-3.6v 120A

V2 2 0.75v- 5.0v 10A

V3 2 0.75v- 5.0v 10A

V4 2 0.75v- 5.0v 10A

Reltech 8014 HTOL System MIDAS™ Dynamic Driver Card

24 Vector channels 8Mb Vector depth

5MHz - Vector frequency 200mA driver per channel

2 Voh levels – 1.0v – 5v Vector looping

20 DUT signal monitor channels Test programme conversion

Real Time Monitoring Functions

 DUT Case Temperature (Tc)

 DUT Junction Temperature (Tj)

Voltage Monitoring: V1 - V4 per group of DUT’s

with auto shut down of all 4 DUT’s

• Current Monitoring: PSU 1-4 per DUT with auto

shut down of all 4 DUT’s

• Monitoring frequency: 100mS

• DUT shut down time: 1.0S

• DUT Monitoring: 20 channels

(typically 1 per DUT) Hi, LO or Activity)