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AFM probes, Membranes. Step Height Standartds, Nano Fabrication
פורטל תעשיית השבבים בישראל מבית מגזין

פורטל תעשיית השבבים בישראל מבית מגזין

צ'יפורטל - פורטל של תעשית השבבים בישראל

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חדשות מתעשיית השבבים בישראל

AFM probes, Membranes. Step Height Standartds, Nano Fabrication

PDFגרסת הדפסהדואר אלקטרוני

Dashro Trade presents localy AppNano, US.

AppNano, U.S.A - Applied NanoStructures, Inc. develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. AppNano's leverage extensive experience in nanofabrication technology and research in AFM probes to supply the highest quality probes utilizing the latest technology in the market. AppNano's in-house clean room facility combined with state-of-the-art characterization tools enables rapid prototyping, adaptability, and versatility in designing and developing new products. Major research programs are continuously underway both in-house and with external collaborators to develop high performance probes for advanced applications. AppNano's mission is to provide the highest quality SPM probes for standard, advanced and customized applications at a faster speed and more affordable price.

In addition to providing you with Appnano's standard catalog of products, AppNano enjoys working with customers to develop new probes or devices for advanced applications. Our experienced R&D Team takes pride in using our knowledge in silicon nanofabrication technology to realize these new ideas.

AppNano's services includes also Fabrication services. For more details don’t hesitate and contact us

Products

Silicon Probes

Standard silicon probes are available for tapping mode, contact mode, and force modulation mode applications.

Silicon Nitride Probes

Silicon nitride probes have a bare silicon tip. They are ideally suited for imaging biological samples in both air and fluid mediums, and are available with a variety of spring constants.

Colloidal Probes

Colloidal Probes are used to study colloidal interactions between two surfaces and to quantify the interactive properties.

Custom Fabrication

Don’t see your product here? Applied NanoStructures creates many custom products upon request.

Membranes

Step Height Standards & Characterizers

 

 

Quick Reference Guide

Silicon Probe

Silicon Nitride Probe

Options

A - Aluminium reflex coating, SS - Super sharp tip, TL - Tipless, G - Gold reflex coating, GG - Tip and reflex side gold coating.

Application

SPM Probe Model

Brief Description

Cantilever
Length (µm)

Spring
Constant (N/m)

Resonance
Frequency (kHz)

Options

Tapping / Non-Contact Mode

ACCESS™ Probes

Silicon Tapping Mode Tip View Probe

160

93

300

ACL Series

Long Cantilever Tapping Mode Probe

225

45

190

A, SS, TL

ACST

Silicon Soft Tapping Mode Probe

150

7

150

ACT Series

Silicon Tapping Mode Probe

125

40

300

A, SS, TL

FORT Series

Force Modulation Mode Probe

225

3.0

62

A, G, GG, SS, TL

HYDRA6R-100N Series

Silicon Nitride Probe, Rectangular Cantilever

100

0.28

66

G, GG, TL

HYDRA6V-100N Series

Silicon Nitride Probe, V- Shape, Narrow Cantilever

100

0.29

66

G, GG, TL

HYDRA6V-100W Series

Silicon Nitride Probe, V- Shape, Wide Cantilever

100

0.41

67

G, GG, TL

Contact Mode

HYDRA4V-100N Series

100

0.088

42

HYDRA6R-200N Series

Silicon Nitride, Rectangular Cantilever

200

0.035

17

G, GG, TL

HYDRA6V-200N Series

Silicon Nitride, V- Shape, Narrow Cantilever

200

0.045

17

G, GG, TL

HYDRA6V-200W Series

Silicon Nitride, V- Shape, Wide Cantilever

200

0.081

17

G, GG, TL

SHOCON Series

Short Cantilever Contact Mode probe

225

0.16

23

A, G, GG, SS, TL

SICON Series

Silicon Contact Mode probe

450

0.29

17

A, G, GG, SS, TL

Biological Applications

HYDRA2R-100N Series

Nitride Probe, Rectangular Cantilever

100

0.011

21

HYDRA2R-50N Series

Nitride Probe, Rectangular Cantilever

50

0.084

77

Force Modulation

FCL Series

5 Tipless Cantilevers per chip for spring constant calibration

52-442

0.12-77

14-1000

FORT Series

Force Modulation Mode Probe

225

3.0

62

A, G, GG, SS, TL

Magnetic Force Imaging

MAGT Series

225

3.0

62

Trench Depth Measurement

HART Series

High Aspect Ratio Silicon Probes

125

40

300

Membranes

Silicon Membranes

Thin Membranes of Silicon

Silicon Nitride Membranes

Thin Membranes of Silicon Nitride

Silicon Oxide Membranes

Thin Membranes of Silicon Oxide

 

 

 

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